1. Advanced software will help you predict the faultcoverage for the test at hand.
高级的软件能帮助你预测手边的测试的故障覆盖率。
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2. The proposed method can generate simplified test patterns with high faultcoverage, and can detect multiple faults as many as possible.
新方法可生成精简的、故障覆盖率高的测试图形，并尽可能多地检测多重故障。
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3. To assure the precision of evaluations and predictions, a good software reliability model should have the function of describing test coverage and can reflect the fault repair process.
4. Experimental results show that the proposed testing algorithms have merits such as high faultcoverage, strong diagnostic ability and less testing time.
实验结果表明，此测试算法具有故障覆盖率高，诊断故障能力强，测试需要的时间少等优点。
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5. The result indicates that the technology manipulates easily and is effective, the faultcoverage reaches 90%, it is a feasible test generation technology.
仿真结果表明，该方法操作简单、有效，故障覆盖率达到了90%，是一种很可行的存储器板测试生成方法。
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6. The first model supposes every test case has equal fault detective ability and can get the same fault coverage.
第一个模型假设每个测试用例有相同的故障检测能力，能获得相同的故障覆盖率；
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7. The experiments indicate that functional test sets may be able to identify functions whose realizations have low path delay faultcoverage.
实验表明，这种功能测试集具有实现低路径延迟故障覆盖范围的功能。
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8. In this paper, we firstly review the Non homogeneous Poisson Process (NHPP) model based on test coverage, and then discuss a Non homogeneous Markov model with fault repair.
本文在基于测试覆盖的NHPP模型的基础上，讨论一种能反映软件错误修复过程的非齐次马尔可夫模型。
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9. DFT circuits implemented in RPR ASIC reduces difficulties in circuit test and greatly improves faultcoverage.
DFT电路的实现大大降低了专用集成电路的测试难度，提高了故障覆盖率。
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10. We step by step find approaches for system reliability from simple to complex upon introducing fault tree analysis, phased mission systems and imperfect coverage, respectively.
11. For testing chip pins, the faultcoverage can reach 100%, and the fault position can be positioned with high accuracy.
对芯片管脚的测试可以提供100%的故障覆盖率，且能实现高精度的故障定位。
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12. To improve the faultcoverage, storage-mode is added to LFSR-mode.
用随机测试模式加存储测试模式，来提高故障覆盖率。
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13. Experimental results show that the proposed strategy is effective in software testing for conquering test blindness, reducing test cost and improving faultcoverage.
15. The configuration structure of test, the faultcoverage, the implementation problems and their solutions were discussed.
文章给出了应用这种方法进行测试的配置结构、故障覆盖率和测试中出现的问题及其解决办法。
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16. And, when coupled with functional testing, the faultcoverage for the entire process is as good as or better than in-circuit testing alone.
加上功能测试，这个过程中检测到的故障率要比单独进行在线测试故障发现率大。
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17. The author uses the C program to finish the parallel fault simulation that is used to calculate the fault coverage.
在电路测试时利用这个程序来计算故障覆盖率。
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18. Coverage is an important concept in fault tolerant systems design and evaluation.
覆盖率是容错系统设计和评估中的重要概念。
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19. Finally, the loss of faultcoverage due to the introduction of the parity tree is analyzed, and the detection of faults in the parity trees are described.
最后，分析了由于奇偶树的引入带来的故障覆盖率的损失及奇偶树中故障的检测。
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20. In order to reduce the loss of the faultcoverage when using the parity tree to compact the test response, a method of grouping compaction of the output pins is proposed in the paper.
为了减少利用奇偶树压缩测试响应时的故障覆盖损失，提出了一种输出端分组压缩的方法。
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21. Besides, there is neither faultcoverage degradation nor extra control signal. So far as we know, this is the first work to demonstrate the capture power reduction on silicon.
22. As an important white-box test method, the basic path test has higher faultcoverage.
基本路径测试是一种重要的白盒测试技术，具有较高的故障覆盖率。
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23. The results of experiments suggest a higher faultcoverage is achieved.
实验结果表明，故障覆盖率取得了满意的结果。
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24. The experiments show that the proposed method can reduce peak power, average power and energy simultaneously at the cost of a little faultcoverage dropping.
25. The result show that a commercial non fault tolerant computer can achieve higher error detection coverage by adding simple software based EDMs in it.
26. Tests results showed that this method could test MCM effectively at a shorter time with a faultcoverage of more than 95%.
建立模型进行验证的结果表明：该方法能有效地测试MCM，缩短了测试时间，故障覆盖率达到95%以上。
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27. Reseeding is a built-in self-test (B. IST) testing method, which is used to improve faultcoverage of pseudo-random testing.
重新播种的测试方法是一种内建自测试方法，它可以用来提高伪随机测试矢量的故障覆盖率。
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28. This paper describes the fault models and test principles of the BS test access port (TAP) lines on PCBs. A test algorithm with high faultcoverage and short time is then presented fort…
29. With ensuring the faultcoverage, the adaptive scan can be ten-fold reduction in the number of test vectors, thus reducing test time and ultimately reduce the cost of chip.
30. With ensuring the faultcoverage, the adaptive scan can be ten-fold reduction in the number of test vectors, thus reducing test time and ultimately reduce the cost of chip.
